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An automatic target detection algorithm based on wavelet analysis for infrared image small target in background of sea and sky
Wei Y(魏颖); Shi ZL(史泽林); Yu HB(于海斌)
Department光电信息研究室
Conference NameConference on Acquisition, Tracking, and Pointing XVII
Conference DateApril 22-22, 2003
Conference PlaceORLANDO, FL
Author of SourceSPIE
Source PublicationACQUISITION, TRACKING, AND POINTING XVII
PublisherSPIE-INT SOC OPTICAL ENGINEERING
Publication PlaceBELLINGHAM
2003
Pages123-131
Indexed ByEI ; CPCI(ISTP)
EI Accession number2003487759554
WOS IDWOS:000185757300014
Contribution Rank1
ISSN0277-786X
ISBN0-8194-4941-5
KeywordImage Recognition Automatic Target Detection Wavelet Multiresolution Analysis Edge Detection Sea-level Line
AbstractAn automatic target detection algorithm is developed for infrared image small target in complicate background of sea and sky. Wavelet multiresolution edge detection algorithm is adopted to detect the sea-level line from coarse to fine. A strip can be decided accordingly as the potential area where the naval vessel targets in infrared images usually appear. We realized target detection by defining an energy function that integrated the results of horizontal wavelet transform. We complete the detection by marking the position where the energy is assumed the maximum and improving the target location precision by comparing the dissimilarity between a couple of windows. Experiment results indicate that the method can detect and locate small targets precisely in an infrared image with high detection probability.
Language英语
Citation statistics
Cited Times:6[WOS]   [WOS Record]     [Related Records in WOS]
Document Type会议论文
Identifierhttp://ir.sia.cn/handle/173321/7957
Collection光电信息技术研究室
Corresponding AuthorWei Y(魏颖)
AffiliationShenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China
Recommended Citation
GB/T 7714
Wei Y,Shi ZL,Yu HB. An automatic target detection algorithm based on wavelet analysis for infrared image small target in background of sea and sky[C]//SPIE. BELLINGHAM:SPIE-INT SOC OPTICAL ENGINEERING,2003:123-131.
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