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Deformable target tracking method based on Lie algebra
Liu YP(刘云鹏); Shi ZL(史泽林); Li GW(李广伟)
Department光电信息研究室
Conference Name5th International Symposium on Multispectral Image Processing and Pattern Recognition
Conference DateNovember 15-17, 2007
Conference PlaceWuhan, China
Author of SourceSPIE, State Key Lab Multi Spectral Informat Proc Technol, Chinese Educ Minist Key Lab Image Proc & Intelligence Control, Huazhong Univ Sci & Technol
Source PublicationMIPPR 2007: AUTOMATIC TARGET RECOGNITION AND IMAGE ANALYSIS; AND MULTISPECTRAL IMAGE ACQUISITION, PTS 1 AND 2
PublisherSPIE-INT SOC OPTICAL ENGINEERING
Publication PlaceBELLINGHAM
2007
Pages78617-78617
Indexed ByEI ; CPCI(ISTP)
EI Accession number20081811235929
WOS IDWOS:000253700100042
Contribution Rank1
ISSN0277-786X
ISBN978-0-8194-6950-2
KeywordLie Group Lie Algebra Target Tracking Gabor Feature Manifold Exponential Mapping
AbstractConventional approaches to object tracking use area correlation, but they are difficult to solve the problem of deformation of object region during tracking. A novel target tracking method based on Lie algebra is presented. We use Gabor feature as target token, model deformation using affine Lie group, and optimize parameters directly on manifold, which can be solved by exponential mapping between Lie Group and its Lie algebra. We analyze the essence of our method and test the algorithm using real image sequences. The experimental results demonstrate that Lie algebra method outperforms other traditional algorithms in efficiency, stabilization and accuracy.
Language英语
Citation statistics
Document Type会议论文
Identifierhttp://ir.sia.cn/handle/173321/7967
Collection光电信息技术研究室
Corresponding AuthorLiu YP(刘云鹏)
Affiliation1.Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, China
2.Graduate School, Chinese Academy of Sciences, Beijing 100049, China
Recommended Citation
GB/T 7714
Liu YP,Shi ZL,Li GW. Deformable target tracking method based on Lie algebra[C]//SPIE, State Key Lab Multi Spectral Informat Proc Technol, Chinese Educ Minist Key Lab Image Proc & Intelligence Control, Huazhong Univ Sci & Technol. BELLINGHAM:SPIE-INT SOC OPTICAL ENGINEERING,2007:78617-78617.
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