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题名: A novel pattern for complex event processing in RFID applications
作者: Ku T(库涛) ; Zhu YL(朱云龙) ; Hu KY(胡琨元) ; Lv CX(吕赐兴)
作者部门: 先进制造技术实验室
会议名称: 4th International Conference on Interoperability for Enterprise Software and Applications (I-ESA 2008)
会议日期: March 26-28, 2008
会议地点: Berlin, GERMANY
会议录: ENTERPRISE INTEROPERABILITY III: NEW CHALLENGES AND INDUSTRIAL APPROACHES
会议录出版者: SPRINGER
会议录出版地: NEW YORK
出版日期: 2008
页码: 595-607
收录类别: CPCI(ISTP)
ISBN号: 978-1-84800-220-3
关键词: formal approaches and formal models of interoperability ; formal approaches to interoperability
摘要: This study investigates Complex Event Processing (CEP) Pattern on Radio-Frequency Identification (RFID) applications. RFID technolgy has brought tremendous benefits for the business by incorporating RFID data into supply chain planning and business processing, however, this progress has also raised important problems for RFID data processing. How to mine the signification information from RFID events is a challenge in RFID applications. In this paper, we take an CEP Pattem-oriented approach to process RFID data. A novel event pattern based on semantics operator is proposed. A formalization event hierarchy is used to model complex event with the event ontology, and provides abstract hierarchical views allowing us to view the system activities at different levels. Several complex event patterns are proposed based on semantic event operators. An algorithm is performed to test reorganization performance of patterns, a rule-based method is used to recognize efficiently on primitive event and composite event. The results showed that the advantage of the proposed complex event pattern approach is remarkable. It is concluded that the method of CEP pattern can simplify and improve RFID application.
语种: 英语
产权排序: 1
内容类型: 会议论文
URI标识: http://ir.sia.cn/handle/173321/8159
Appears in Collections:工业信息学研究室_先进制造技术研究室_会议论文

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Recommended Citation:
库涛; 朱云龙; 胡琨元; 吕赐兴.A novel pattern for complex event processing in RFID applications.见:SPRINGER.ENTERPRISE INTEROPERABILITY III: NEW CHALLENGES AND INDUSTRIAL APPROACHES,NEW YORK,2008,595-607
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