中国科学院沈阳自动化研究所机构知识库
Advanced  
SIA OpenIR  > 机器人学研究室  > 会议论文
题名: 3D nano forces sensing for an AFM based nanomanipulator
作者: Tian XJ(田孝军) ; Liu LQ(刘连庆) ; Jiao ND(焦念东) ; Wang YC(王越超) ; Dong ZL(董再励) ; Xi N(席宁)
作者部门: 机器人学研究室
会议名称: International Conference on Information Acquistition
会议日期: June 21-25, 2004
会议地点: Hefei, China
会议主办者: Int Assoc Informat Acquisit, Int Journal Informat Acquisit, IEEE Robot & Automat Soc, Natl Nat Sci Fdn China, Inst Intelligent Mach, Univ Sci & Technol China
会议录: ICIA 2004: Proceedings of 2004 International Conference on Information Acquisition
会议录出版者: IEEE
会议录出版地: NEW YORK
出版日期: 2004
页码: 208-212
收录类别: CPCI(ISTP) ; EI
ISBN号: 0-7803-8629-9
关键词: AFM based nanomanipulator ; 3D nano forces modeling ; parameters calibration
摘要: Atomic Force Microscope (AFM) has been proven to be a useful tool to characterize and change the sample surface down to the nanometer scale. However, in the AFM based nano manipulation, the main problem is the lack of real-time sensory feedback for a user, which makes the manipulation almost in the dark and inefficient. In this paper, the AFM probe micro cantilever-tip is used not only as an end effector but also as a three dimensional (3D) nano forces sensor for measuring the interactive forces between the AFM probe tip and the object or substrate in nanomanipulation. The nano forces acting on cantilever-tip is modeled and the real-time PSD signals are used to calculate the forces. With new parameters calibration method used, the real 3D nano forces can be easily got and then fed to a haptic/force device for operator to feel, thus real-time manipulation forces information is obtained, with which the efficiency of nanomanipulation can be significantly improved. Nano-imprint experiments verify the effectiveness of 3D forces sensing system and efficiency improvement of nano manipulation using this system.
语种: 英语
产权排序: 1
内容类型: 会议论文
URI标识: http://ir.sia.cn/handle/173321/8458
Appears in Collections:机器人学研究室_会议论文

Files in This Item: Download All
File Name/ File Size Content Type Version Access License
HYQW000003.pdf(681KB)----开放获取View Download

Recommended Citation:
田孝军; 刘连庆; 焦念东; 王越超; 董再励; 席宁.3D nano forces sensing for an AFM based nanomanipulator.见:IEEE .ICIA 2004: Proceedings of 2004 International Conference on Information Acquisition,NEW YORK,2004,208-212
Service
Recommend this item
Sava as my favorate item
Show this item's statistics
Export Endnote File
Google Scholar
Similar articles in Google Scholar
[田孝军]'s Articles
[刘连庆]'s Articles
[焦念东]'s Articles
CSDL cross search
Similar articles in CSDL Cross Search
[田孝军]‘s Articles
[刘连庆]‘s Articles
[焦念东]‘s Articles
Related Copyright Policies
Null
Social Bookmarking
Add to CiteULike Add to Connotea Add to Del.icio.us Add to Digg Add to Reddit
文件名: HYQW000003.pdf
格式: Adobe PDF
此文件暂不支持浏览
所有评论 (0)
暂无评论
 
评注功能仅针对注册用户开放,请您登录
您对该条目有什么异议,请填写以下表单,管理员会尽快联系您。
内 容:
Email:  *
单位:
验证码:   刷新
您在IR的使用过程中有什么好的想法或者建议可以反馈给我们。
标 题:
 *
内 容:
Email:  *
验证码:   刷新

Items in IR are protected by copyright, with all rights reserved, unless otherwise indicated.

 

 

Valid XHTML 1.0!
Copyright © 2007-2016  中国科学院沈阳自动化研究所 - Feedback
Powered by CSpace