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题名: Accurate Estimation of Tip Shape for Reconstructing AFM Image
作者: Yuan S(袁帅) ; Liu LQ(刘连庆) ; Miao L(缪磊) ; Dong ZL(董再励) ; Xi N(席宁) ; Wang YC(王越超)
作者部门: 机器人学研究室
会议名称: IEEE Nanotechnology Materials and Devices Conference
会议日期: June 2-5, 2009
会议地点: Traverse City, MI
会议主办者: IEEE
会议录: 2009 IEEE NANOTECHNOLOGY MATERIALS AND DEVICES CONFERENCE
会议录出版者: IEEE
会议录出版地: NEW YORK
出版日期: 2009
页码: 96-99
收录类别: CPCI(ISTP) ; EI
ISBN号: 978-1-4244-4695-7
关键词: AFM ; Blind Tip Estimation ; Porous Aluminium ; Math Morphology
摘要: AFM image is often distorted due to the influence of the tip shape. This problem has become one of the major obstacles in nano-observation. Therefore it is necessary to develop a compensation method to improve the quality of the AFM image. The common used method today is image reconstruction with deconvolution operator based on the tip shape built through blind tip estimation algorithm. However, the current algorithm has difficulties in getting the optimal noise threshold, which is essential for reducing the noise influence during the tip evaluation. This paper proposed a new method to solve this problem, through which the optimal threshold can be easily determined based on the comparison of tip section profile P-alpha and tip standard profile P-s. The experimental results validate the effect of the proposed method, and it also shows that the image quality has been greatly improved.
产权排序: 1
内容类型: 会议论文
URI标识: http://ir.sia.cn/handle/173321/8533
Appears in Collections:机器人学研究室_会议论文

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