中国科学院沈阳自动化研究所机构知识库
Advanced  
SIA OpenIR  > 机器人学研究室  > 会议论文
题名: Cutting graphene using an atomic force microscope based nanorobot
作者: Zhang Y(张嵛) ; Liu LQ(刘连庆) ; Xi N(席宁) ; Wang YC(王越超) ; Dong ZL(董再励)
作者部门: 机器人学研究室
会议名称: 2010 10th IEEE International Conference on Nanotechnology and Joint Symposium with Nano Korea 2010 KINTEX (IEEE-NANO 2010)
会议日期: August 17-20, 2010
会议地点: Seoul, South Korea
会议录: Proceedings 2010 10th IEEE International Conference on Nanotechnology and Joint Symposium with Nano Korea 2010 KINTEX (IEEE-NANO 2010)
会议录出版者: IEEE
会议录出版地: Piscataway, NJ, USA
出版日期: 2010
页码: 639-644
收录类别: EI
ISBN号: 978-1-4244-7033-4
摘要: Rapid progress in graphene-based applications is calling for an inexpensive technique for creating mass graphene components with specialized shapes, sizes, and edge structures. In this paper, an Atomic Force Microscopy (AFM) based mechanical cutting method is developed to approach this goal, through which we are able to structure trenches into multilayer graphene flakes with different directions, and generate different graphene shapes: graphene nanoribbons and triangles. Combining parallel multi-tip technology, this method makes it possible to fabricate large-scale graphene-based device at low cost and high efficiency. This research also reveals that the cutting force of graphene varies with different cutting directions, based on which a close-loop fabrication method with interaction force as real-time feedback may be developed for tailoring graphene into desired edge structures and shapes in a controllable high-precise way.
语种: 英语
产权排序: 1
内容类型: 会议论文
URI标识: http://ir.sia.cn/handle/173321/8623
Appears in Collections:机器人学研究室_会议论文

Files in This Item: Download All
File Name/ File Size Content Type Version Access License
HYQW000409.pdf(454KB)----开放获取View Download

Recommended Citation:
张嵛; 刘连庆; 席宁; 王越超; 董再励.Cutting graphene using an atomic force microscope based nanorobot.见:IEEE .Proceedings 2010 10th IEEE International Conference on Nanotechnology and Joint Symposium with Nano Korea 2010 KINTEX (IEEE-NANO 2010),Piscataway, NJ, USA,2010,639-644
Service
Recommend this item
Sava as my favorate item
Show this item's statistics
Export Endnote File
Google Scholar
Similar articles in Google Scholar
[张嵛]'s Articles
[刘连庆]'s Articles
[席宁]'s Articles
CSDL cross search
Similar articles in CSDL Cross Search
[张嵛]‘s Articles
[刘连庆]‘s Articles
[席宁]‘s Articles
Related Copyright Policies
Null
Social Bookmarking
Add to CiteULike Add to Connotea Add to Del.icio.us Add to Digg Add to Reddit
文件名: HYQW000409.pdf
格式: Adobe PDF
此文件暂不支持浏览
所有评论 (0)
暂无评论
 
评注功能仅针对注册用户开放,请您登录
您对该条目有什么异议,请填写以下表单,管理员会尽快联系您。
内 容:
Email:  *
单位:
验证码:   刷新
您在IR的使用过程中有什么好的想法或者建议可以反馈给我们。
标 题:
 *
内 容:
Email:  *
验证码:   刷新

Items in IR are protected by copyright, with all rights reserved, unless otherwise indicated.

 

 

Valid XHTML 1.0!
Copyright © 2007-2016  中国科学院沈阳自动化研究所 - Feedback
Powered by CSpace