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题名: Detection and real-time correction of faulty visual feedback in atomic force microscopy based nanorobotic manipulation
作者: Liu LQ(刘连庆) ; Xi N(席宁) ; Luo, Yilun ; Wang YC(王越超) ; Zhang JB(张江波) ; Li GY(李广勇)
作者部门: 机器人学研究室
会议名称: IEEE International Conference on Robotics and Automation
会议日期: May 19-23, 2008
会议地点: Pasadena, CA
会议主办者: IEEE
会议录: 2008 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND AUTOMATION, VOLS 1-9
会议录出版者: IEEE
会议录出版地: NEW YORK
出版日期: 2008
页码: 431-436
收录类别: CPCI(ISTP) ; EI
ISSN号: 1050-4729
ISBN号: 978-1-4244-1646-2
摘要: One of the main roadblocks to Atomic Force Microscope (AFM) based nanomanipulation is lack of real time visual feedback. Although the model based visual feedback can partly solve this problem, its unguaranteed reliability due to the inaccurate models in nano-environment still limits the efficiency of AFM based nanomanipulation. This paper introduce a Realtime Fault Detection and Correction (RFDC) method to improve the reliability of the visual feedback. By utilizing Kalman filter and local scan technologies, the RFDC method not only can realtime detect the fault display caused by the modeling error, but also can on-line correct it without interrupting manipulation. In this way, the visual feedback keeps consistent with the true environment changes during manipulation, which makes several operations being finished without a image scanning in between. The theoretical study and the implementation of the RFDC method are elaborated in this paper. Experiments of manipulating nano-particles have been carried out to demonstrate the effectiveness and efficiency of the proposed method.
语种: 英语
产权排序: 1
内容类型: 会议论文
URI标识: http://ir.sia.cn/handle/173321/8645
Appears in Collections:机器人学研究室_会议论文

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Recommended Citation:
刘连庆; 席宁; Luo, Yilun; 王越超; 张江波; 李广勇.Detection and real-time correction of faulty visual feedback in atomic force microscopy based nanorobotic manipulation.见:IEEE .2008 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND AUTOMATION, VOLS 1-9,NEW YORK,2008,431-436
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