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题名: Development of a haptic user interface for surface sensing and nanomanipulation based on atomic force microscope
作者: Liu LQ(刘连庆) ; Jiao ND(焦念东) ; Tian XJ(田孝军) ; Dong ZL(董再励) ; Xi N(席宁) ; Li WR(李文荣) ; Wang YC(王越超)
作者部门: 机器人学研究室
会议名称: IEEE International Conference of Nano/Micro Engineered and Molecular Systems
会议日期: January 18-21, 2006
会议地点: Zhuhai, China
会议主办者: IEEE
会议录: 2006 1st IEEE International Conference on Nano/Micro Engineered and Molecular Systems, Vols 1-3
会议录出版者: IEEE
会议录出版地: NEW YORK
出版日期: 2006
页码: 900-904
收录类别: CPCI(ISTP) ; EI
ISBN号: 978-1-4244-0139-0
关键词: AFM ; force feedback ; nanomanipulation
摘要: ddThe standard application of Atomic Force Microscope (AFM) is observation with subnanometer resolution. As development of nano-tech, AFM has also become popular as a simple manipulation tool. We have proved that developing a Haptic User Interface(HUI) can significantly improve these functions of AFM. When going on observation, under the assistance of HUI, the user can not only observe surface characters through the scanning image, meanwhile, he can also "touch" the surface with a force proportional to the imaging signal on his hand, which help to deepen people's understanding to surface characters. HUI can work for surface sensing online or offline, as long as the imaging signals could be obtained. Changing the observation mode of AFM from only imaging to both imaging and sensing. When going on nanomanipulation, through HUI the user can not only feel the real-time operation force, furthermore he can directly control the tip motion of AFM. this significantly improved the efficiency and effectiveness of AFM based nanomanipulation.
产权排序: 1
内容类型: 会议论文
URI标识: http://ir.sia.cn/handle/173321/8651
Appears in Collections:机器人学研究室_会议论文

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