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题名: Feature referenced tip localization enhanced by probability motion model for AFM based nanomanipulations
作者: Yuan S(袁帅) ; Liu LQ(刘连庆) ; Wang ZD(王志东) ; Xi N(席宁) ; Wang YC(王越超) ; Dong ZL(董再励) ; Wang ZY(王智宇) ; Wang ZB(王智博)
作者部门: 机器人学研究室
会议名称: 2011 IEEE International Conference on Robotics and Biomimetics (ROBIO)
会议日期: December 7-11, 2011
会议地点: Phuket, Thailand
会议主办者: IEEE Robotics and Automation Society
会议录: 2011 IEEE International Conference on Robotics and Biomimetics (ROBIO)
会议录出版者: IEEE Computer Society
会议录出版地: Piscataway, NJ
出版日期: 2011
页码: 1421-1426
收录类别: EI
ISBN号: 978-1-4577-2136-6
关键词: Creep ; Probabilistic logic ; Sensors ; Trajectory ; Uncertainty ; Voltage control
摘要: The spatial uncertainties of tip positioning due to the nonlinearity of the PZT scanner and thermal drift hinder the further application of the AFM based nanomanipulation. This paper brings forward feature referenced tip localization enhanced by probability motion model to reduce the spatial uncertainties. An improved motion model is probabilistically built by incorporating the PI model, the creep model and the thermal drift model. For calibrating the accurate model parameters, the statistical experiments are designed and performed. Then the tip position is optimally estimated by combining with a local scan based feature sensing method. The simulation and corresponding experiments are performed to illustrate the validity and feasibility of the calibrated parameters and the algorithm.
产权排序: 1
内容类型: 会议论文
URI标识: http://ir.sia.cn/handle/173321/8710
Appears in Collections:机器人学研究室_会议论文

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