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题名: Modeling and analyzing nano-particle pushing with an AFM by using nano-hand strategy
作者: Hou J(侯静) ; Wang ZD(王志东) ; Liu LQ(刘连庆) ; Yang YL(杨永良) ; Dong ZL(董再励) ; Wu CD(吴成东)
作者部门: 机器人学研究室
会议名称: 5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010
会议日期: January 20-23, 2010
会议地点: Xiamen, China
会议录: 2010 IEEE 5th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010
会议录出版者: IEEE Computer Society
会议录出版地: Piscataway, NJ
出版日期: 2010
页码: 518-523
收录类别: EI
ISBN号: 978-1-4244-6543-9
关键词: Atomic force microscopy ; Atoms ; Behavioral research ; Kinematics ; Mathematical models ; Micromanipulators ; Nanoprobes ; Nanotechnology
摘要: One of the major limitations for Atomic Force Microscopy (AFM) based nanoparticle pushing is that AFM only has one sharp tip as the end-effector. The interaction force between the nanoparticle and the tip is applied through a single point, which often leads the AFM tip to slip-away from the nanoparticle due to their small touch area. Then several minutes is needed to relocate the missed nanoparticle by a new image scan. Moreover, if the nanoparticle is very soft, the sharp tip may damage the particle instead of pushing it away due to the cutting effect of the sharp tip. In this paper, a nano-hand strategy is proposed to resolve this problem. Based on the theoretical analysis to the behavior model of nanoparticle, the pushing points, pushing step-length and pushing speed of AFM tip are planned artfully, through which a multi-tip manipulation effect can be imitated with a single tip. The nanoparticle is pushed as by a virtual nano-hand during manipulation,. In this way, the slip-away problem due to single AFM tip pushing can be get rid of efficiently. The simulation and experiments results show the increased effectiveness of AFM based nanomanipulation.
产权排序: 1
内容类型: 会议论文
URI标识: http://ir.sia.cn/handle/173321/8781
Appears in Collections:机器人学研究室_会议论文

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