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Real-time state estimation and fault detection for controlling atomic force microscope based Nano Manipualtion
Liu LQ(刘连庆); Xi N(席宁); Luo, Yilun; Zhang JB(张江波); Li GY(李广勇); Wang YC(王越超)
Department机器人学研究室
Conference NameThe 17th International Federation of Automatic Control (IFAC) World Congress
Conference DateJuly 6-11, 2008
Conference PlaceSeoul, Korea
Author of SourceIFAC
Source PublicationProceedings of the 17th International Federation of Automatic Control (IFAC) World Congress
PublisherIFAC
2008
Pages9424-9429
Contribution Rank1
KeywordAtomic Force Microscopy Fault Detection Micromanipulators Microsystems Nanotechnology Robotics Technology Visual Communication
AbstractThe main problem of Atomic Force Microscope (AFM) based nanomanipulation is the lack of real-time visual feedback. Although the model based visual feedback can partly solve this problem, the incorrect display caused by the uncertainties in the nano-environment often leads to a failed nanomanipulation. In this paper, a general strategy with three-level structure is proposed to overcome this problem. With this three-level strategy, the incorrect display can be not only real-time detected, but also on-line corrected. The difficulty to implement this strategy is that there is no continuous way to describe and model the system since both discrete and continuous commands are involved. A Petri-net based method is proposed to organize this strategy such that task scheduling, which usually deals with discrete events, as well as task planning, which usually deals with continuous events can be treated in a unified framework. This Petri-net organized strategy provides general instructions to AFM based manipulation for displaying a visual feedback which can be as close as possible to the true environment. The experimental results presented in the paper demonstrate the advantage of the proposed strategy. It also shows the increased efficiency of the AFM based nanomanipulation.
Language英语
Document Type会议论文
Identifierhttp://ir.sia.cn/handle/173321/8842
Collection机器人学研究室
Corresponding AuthorLiu LQ(刘连庆)
Affiliation1.Robotics Laboratory, Chinese Academy of Sciences
2.Dept. of Electrical and Computer Engineering, Michigan State University
3.Dept.of Electrical and Computer Engineering, University of Pittsburgh
4.Graduate School of Chinese Academy of Sciences
Recommended Citation
GB/T 7714
Liu LQ,Xi N,Luo, Yilun,et al. Real-time state estimation and fault detection for controlling atomic force microscope based Nano Manipualtion[C]//IFAC:IFAC,2008:9424-9429.
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