SIA OpenIR  > 工业控制网络与系统研究室
Common cause failure analysis of fault tolerance systems with diversity defense mechanism
Wang K(王锴); Xu AD(徐皑冬); Wang H(王宏); Song Y(宋岩); Bai ZY(白占元)
作者部门工业控制网络与系统研究室
会议名称2012 IEEE International Conference on Industrial Technology, ICIT 2012
会议日期March 19-21, 2012
会议地点Athens, Greece
会议主办者The Institute of Electrical andElectronics Engineers, Inc.; Industrial Electronics Society; University of Patras
会议录名称2012 IEEE International Conference on Industrial Technology, ICIT 2012, Proceedings
出版者IEEE Computer Society
出版地Piscataway, NJ
2012
页码778-782
收录类别EI ; CPCI(ISTP)
EI收录号20123015268501
WOS记录号WOS:000309185900130
产权排序1
ISBN号978-1-4673-0342-2
关键词Reliability Analysis
摘要Common cause failures (CCF) are a serious threat to redundant system reliability. It is therefore important to quantify and model CCF in reliability assessments. Design diversity has long been used to protect redundant systems against CCF. However, it is difficult to quantify the effects of diversity on system reliability. Therefore, a novel method based on Root Cause (RC) and Coupling Factor (CF) is proposed to assess diverse redundancy system reliability in this paper. The key idea of the novel method is to classify the RCs into (sub-)categories and then assess the corresponding CFs between redundant components respectively based characteristics of diversity. A novel CCF model is proposed to describe the relationship between CCF probability and diversity. Finally, aiming at the CCF induced by external environment stress an example is given to illustrate the usage of the novel method.
语种英语
引用统计
被引频次:1[WOS]   [WOS记录]     [WOS相关记录]
文献类型会议论文
条目标识符http://ir.sia.cn/handle/173321/9894
专题工业控制网络与系统研究室
作者单位1.Key Laboratory of Industrial Informatics, Shenyang Institute of Automation, Chinese Academy of Sciences, China
2.Graduate School of the Chinese Academy of Sciences, China
推荐引用方式
GB/T 7714
Wang K,Xu AD,Wang H,et al. Common cause failure analysis of fault tolerance systems with diversity defense mechanism[C]//The Institute of Electrical andElectronics Engineers, Inc.; Industrial Electronics Society; University of Patras. Piscataway, NJ:IEEE Computer Society,2012:778-782.
条目包含的文件 下载所有文件
文件名称/大小 文献类型 版本类型 开放类型 使用许可
Common cause failure(595KB) 开放获取CC BY-NC-SA浏览 下载
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[Wang K(王锴)]的文章
[Xu AD(徐皑冬)]的文章
[Wang H(王宏)]的文章
百度学术
百度学术中相似的文章
[Wang K(王锴)]的文章
[Xu AD(徐皑冬)]的文章
[Wang H(王宏)]的文章
必应学术
必应学术中相似的文章
[Wang K(王锴)]的文章
[Xu AD(徐皑冬)]的文章
[Wang H(王宏)]的文章
相关权益政策
暂无数据
收藏/分享
文件名: Common cause failure analysis of fault tolerance systems with diversity defense mechanism.pdf
格式: Adobe PDF
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。