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Common cause failure analysis of fault tolerance systems with diversity defense mechanism
Wang K(王锴); Xu AD(徐皑冬); Wang H(王宏); Song Y(宋岩); Bai ZY(白占元)
Department工业控制网络与系统研究室
Conference Name2012 IEEE International Conference on Industrial Technology, ICIT 2012
Conference DateMarch 19-21, 2012
Conference PlaceAthens, Greece
Author of SourceThe Institute of Electrical andElectronics Engineers, Inc.; Industrial Electronics Society; University of Patras
Source Publication2012 IEEE International Conference on Industrial Technology, ICIT 2012, Proceedings
PublisherIEEE Computer Society
Publication PlacePiscataway, NJ
2012
Pages778-782
Indexed ByEI ; CPCI(ISTP)
EI Accession number20123015268501
WOS IDWOS:000309185900130
Contribution Rank1
ISBN978-1-4673-0342-2
KeywordReliability Analysis
AbstractCommon cause failures (CCF) are a serious threat to redundant system reliability. It is therefore important to quantify and model CCF in reliability assessments. Design diversity has long been used to protect redundant systems against CCF. However, it is difficult to quantify the effects of diversity on system reliability. Therefore, a novel method based on Root Cause (RC) and Coupling Factor (CF) is proposed to assess diverse redundancy system reliability in this paper. The key idea of the novel method is to classify the RCs into (sub-)categories and then assess the corresponding CFs between redundant components respectively based characteristics of diversity. A novel CCF model is proposed to describe the relationship between CCF probability and diversity. Finally, aiming at the CCF induced by external environment stress an example is given to illustrate the usage of the novel method.
Language英语
Citation statistics
Cited Times:1[WOS]   [WOS Record]     [Related Records in WOS]
Document Type会议论文
Identifierhttp://ir.sia.cn/handle/173321/9894
Collection工业控制网络与系统研究室
Affiliation1.Key Laboratory of Industrial Informatics, Shenyang Institute of Automation, Chinese Academy of Sciences, China
2.Graduate School of the Chinese Academy of Sciences, China
Recommended Citation
GB/T 7714
Wang K,Xu AD,Wang H,et al. Common cause failure analysis of fault tolerance systems with diversity defense mechanism[C]//The Institute of Electrical andElectronics Engineers, Inc.; Industrial Electronics Society; University of Patras. Piscataway, NJ:IEEE Computer Society,2012:778-782.
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