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中国科学院沈阳自动化研究所机构知识库
Knowledge Management System of Shenyang Institute of Automation, CAS
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机器人学研究室 [11]
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李广勇 [11]
Lianqing ... [10]
Xi Ning [8]
王越超 [7]
董再励 [1]
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Online Determination of Graphene Lattice Orientation Through Lateral Forces
期刊论文
Nanoscale Research Letters, 2016, 卷号: 11, 期号: 1, 页码: 1-8
Authors:
Zhang Y(张嵛)
;
Yu FH(于繁华)
;
Li GY(李广勇)
;
Liu LQ(刘连庆)
;
Liu GJ(刘光洁)
;
Zhang ZY(张志勇)
;
Wang YC(王越超)
;
Wejinya, Uchechukwu C.
;
Xi N(席宁)
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Submit date:2016/09/04
Graphene
Lattice Orientation
Manufacturing
Frequency
In-Phase Bias Modulation Mode of Scanning Ion Conductance Microscopy With Capacitance Compensation
期刊论文
IEEE Transactions on Industrial Electronics, 2015, 卷号: 62, 期号: 10, 页码: 6508-6518
Authors:
Li P(李鹏)
;
Liu LQ(刘连庆)
;
Yang Y(杨洋)
;
Wang YC(王越超)
;
Li GY(李广勇)
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View/Download:255/59
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Submit date:2015/10/08
Capacitance Compensation (Cc)
In-phase Bias Modulation (Ipbm) Mode
Scanning Ion Conductance Microscopy (Sicm)
Signal-to-noise Ratio (Snr)
Development of Mechanostimulated Patch-Clamp System for Cellular Physiological Study
期刊论文
IEEE/ASME TRANSACTIONS ON MECHATRONICS, 2014, 卷号: 19, 期号: 4, 页码: 1138-1147
Authors:
Zhang CL(张常麟)
;
Li P(李鹏)
;
Liu LQ(刘连庆)
;
Wang YC(王越超)
;
Gao ZB(高召兵)
;
Li GY(李广勇)
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  |  
Submit date:2013/12/27
Atomic Force Microscope (Afm)
Mechanosensitive (Ms) Ion Channel
Planar Patch Clamp
Drift Compensation in AFM-Based Nanomanipulation by Strategic Local Scan
期刊论文
IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, 2012, 卷号: 9, 期号: 4, 页码: 755-762
Authors:
Li GY(李广勇)
;
Wang, Yucai
;
Liu LQ(刘连庆)
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View/Download:690/121
  |  
Submit date:2012/11/29
Atomic Force Microscope (Afm)
Drift Compensation
Nanomanipulation
System positioning error compensated by local scan in atomic force microscope based nanomanipulation
会议论文
2008 3RD IEEE INTERNATIONAL CONFERENCE ON NANO/MICRO ENGINEERED AND MOLECULAR SYSTEMS, VOLS 1-3, Sanya, China, January 6-9, 2008
Authors:
Liu LQ(刘连庆)
;
Xi N(席宁)
;
Zhang JB(张江波)
;
Li GY(李广勇)
;
Wang YC(王越超)
;
Dong ZL(董再励)
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Submit date:2012/06/06
Sensor Referenced Real-Time Videolization of Atomic Force Microscopy for Nanomanipulations
期刊论文
IEEE/ASME Transactions on Mechatronics, 2008, 卷号: 13, 期号: 1, 页码: 76-85
Authors:
Liu LQ(刘连庆)
;
Yilun Luo
;
Xi N(席宁)
;
Wang YC(王越超)
;
Zhang JB(张江波)
;
Li GY(李广勇)
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Submit date:2012/05/29
Atomic Force Microscopy (Afm)
Fault Detection
Local Scan
Nanomanipulation
Detection and real-time correction of faulty visual feedback in atomic force microscopy based nanorobotic manipulation
会议论文
2008 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND AUTOMATION, VOLS 1-9, Pasadena, CA, May 19-23, 2008
Authors:
Liu LQ(刘连庆)
;
Xi N(席宁)
;
Luo, Yilun
;
Wang YC(王越超)
;
Zhang JB(张江波)
;
Li GY(李广勇)
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Submit date:2012/06/06
Sensor referenced guidance and control for robotic nanomanipulation
会议论文
2007 IEEE/RSJ INTERNATIONAL CONFERENCE ON INTELLIGENT ROBOTS AND SYSTEMS, VOLS 1-9, San Diego, CA, October 29 - November 2, 2007
Authors:
Liu LQ(刘连庆)
;
Xi N(席宁)
;
Luo, Yilun
;
Zhang JB(张江波)
;
Li GY(李广勇)
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  |  
Submit date:2012/06/06
Real-time Position Error Detecting in Nano-manipulation Using Kalman Filter
会议论文
2007 7TH IEEE CONFERENCE ON NANOTECHNOLOGY, VOL 1-3, Hong Kong, China, August 2-5, 2007
Authors:
Liu LQ(刘连庆)
;
Xi N(席宁)
;
Luo, Yilun
;
Zhang JB(张江波)
;
Li GY(李广勇)
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  |  
Submit date:2012/06/06
On-line sensing and display in atomic force microscope based nanorobotic manipulation
会议论文
2007 IEEE/ASME INTERNATIONAL CONFERENCE ON ADVANCED INTELLIGENT MECHATRONICS, VOLS 1-3, Zurich, SWITZERLAND, September 4-7, 2007
Authors:
Liu LQ(刘连庆)
;
Zhang JB(张江波)
;
Li GY(李广勇)
;
Xi N(席宁)
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Submit date:2012/06/06