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Phase shifting-based debris effect detection in USV-assisted AFM nanomachining 期刊论文
Applied Surface Science, 2017, 卷号: 413, 页码: 317-326
Authors:  Shi JL(施佳林);  Liu LQ(刘连庆);  Yu P(于鹏);  Cong Y(丛杨);  Li GY(李广勇)
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Atomic Force Microscopy (Afm)  Nanomachining  Ultrasonic Vibration  Thin-film  
无权访问的条目 期刊论文
Authors:  Chen, Zhen;  Ma, Ge;  Chen ZH(陈志鸿);  Zhang YG(张永光);  Zhang, Zhe;  Gao, Jinwei;  Meng QG(孟庆国);  Yuan MZ(苑明哲);  Wang, Xin;  Liu, Junming;  Zhou, Guofu
Adobe PDF(2228Kb)  |  Favorite  |  View/Download：187/51  |  Submit date：2017/01/08