Chinese | English

Search in the results

SIA OpenIR

Browse/Search Results:  1-2 of 2 Help

Filters        
Selected(0)Clear Items/Page:    Sort:
Phase shifting-based debris effect detection in USV-assisted AFM nanomachining 期刊论文
Applied Surface Science, 2017, 卷号: 413, 页码: 317-326
Authors:  Shi JL(施佳林);  Liu LQ(刘连庆);  Yu P(于鹏);  Cong Y(丛杨);  Li GY(李广勇)
Adobe PDF(3227Kb)  |  Favorite  |  View/Download：271/70  |  Submit date：2017/05/01
Atomic Force Microscopy (Afm)  Nanomachining  Ultrasonic Vibration  Thin-film  
无权访问的条目 期刊论文
Authors:  Chen, Zhen;  Ma, Ge;  Chen ZH(陈志鸿);  Zhang YG(张永光);  Zhang, Zhe;  Gao, Jinwei;  Yuan MZ(苑明哲);  Wang, Xin;  Liu, Junming;  Zhou, Guofu
Adobe PDF(2228Kb)  |  Favorite  |  View/Download：189/51  |  Submit date：2017/01/08