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In-Phase Bias Modulation Mode of Scanning Ion Conductance Microscopy With Capacitance Compensation 期刊论文
IEEE Transactions on Industrial Electronics, 2015, 卷号: 62, 期号: 10, 页码: 6508-6518
Authors:  Li P(李鹏);  Liu LQ(刘连庆);  Yang Y(杨洋);  Wang YC(王越超);  Li GY(李广勇)
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Capacitance Compensation (Cc)  In-phase Bias Modulation (Ipbm) Mode  Scanning Ion Conductance Microscopy (Sicm)  Signal-to-noise Ratio (Snr)  
虚拟纳米手操作方法研究 学位论文
博士, 沈阳: 中国科学院沈阳自动化研究所, 2014
Authors:  王智宇
Adobe PDF(3189Kb)  |  Favorite  |  View/Download:128/6  |  Submit date:2015/08/20
原子力显微镜微纳操作  纳米手  概率运动模型  迟滞蠕变补偿  
Manipulation of DNA origami nanotubes in liquid using a programmable tapping mode AFM 会议论文
8th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems, IEEE NEMS 2013, Suzhou, China, April 7-10, 2013
Authors:  Li LH(李龙海);  Tian XJ(田孝军);  Dong ZL(董再励);  Liu LQ(刘连庆);  Tabata, Osamu;  Li WJ(李文荣)
View  |  Adobe PDF(621Kb)  |  Favorite  |  View/Download:649/170  |  Submit date:2013/10/04
Atomic Force Microscopy  Liquids  Mica  Micromanipulators  Nanoprobes  Nanotechnology  Nanotubes  
Imaging and measuring the molecular force of lymphoma pathological cells using atomic force microscopy 期刊论文
Scanning, 2013, 卷号: 35, 期号: 1, 页码: 40-46
Authors:  Li M(李密);  Xiao XB(肖秀斌);  Liu LQ(刘连庆);  Xi N(席宁);  Wang YC(王越超);  Dong ZL(董再励);  Zhang WJ(张伟京)
View  |  Adobe PDF(382Kb)  |  Favorite  |  View/Download:802/163  |  Submit date:2013/04/21
Atomic Force Microscopy  Cytology  Molecules  Monoclonal Antibodies  Nanoprobes  Oncology  Polyethylene Glycols  Topography  
面向纳米传感器制造的介电泳基本原理及装配方法研究 学位论文
博士, 沈阳: 中国科学院沈阳自动化研究所, 2010
Authors:  李明林
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介电泳  纳米制造  金纳米粒子  碳纳米管  纳米传感器  
Modeling and analyzing nano-particle pushing with an AFM by using nano-hand strategy 会议论文
2010 IEEE 5th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010, Xiamen, China, January 20-23, 2010
Authors:  Hou J(侯静);  Wang ZD(王志东);  Liu LQ(刘连庆);  Yang YL(杨永良);  Dong ZL(董再励);  Wu CD(吴成东)
Adobe PDF(555Kb)  |  Favorite  |  View/Download:635/184  |  Submit date:2012/06/06
Atomic Force Microscopy  Atoms  Behavioral Research  Kinematics  Mathematical Models  Micromanipulators  Nanoprobes  Nanotechnology  
AFM tip on-line positioning by using the landmark in nano-manipulation 会议论文
2010 IEEE Nanotechnology Materials and Devices Conference, NMDC2010, Monterey, CA, United states, October 12-15, 2010
Authors:  Yuan S(袁帅);  Liu LQ(刘连庆);  Wang ZD(王志东);  Xi N(席宁);  Wang YC(王越超);  Dong ZL(董再励);  Wang ZY(王智宇)
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Nanoprobes  Nanotechnology