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The influence of probe lift-up height on CNT electrical properties measurement under EFM DC mode 期刊论文
CHINESE SCIENCE BULLETIN, 2014, 卷号: 59, 期号: 14, 页码: 1591-1596
Authors:  Zhao ZX(赵增旭);  Tian XJ(田孝军);  Liu J(刘杰);  Dong ZL(董再励);  Liu LQ(刘连庆)
View  |  Adobe PDF(741Kb)  |  Favorite  |  View/Download:463/73  |  Submit date:2014/05/14
Electrical Properties Of Cnt  Efm  Lift-up Height Of Probe  Phase Response