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AFM Tip Position Control in situ for Effective Nano-Manipulation 期刊论文
IEEE/ASME Transactions on Mechatronics, 2018, 卷号: 23, 期号: 6, 页码: 2825-2836
Authors:  Yuan S(袁帅);  Wang ZD(王志东);  Xi N(席宁);  Wang YC(王越超);  Liu LQ(刘连庆)
View  |  Adobe PDF(5256Kb)  |  Favorite  |  View/Download:125/28  |  Submit date:2018/09/30
Afm Based Nano-manipulation  Afm Tip Localization  Stochastic Calibration  Kalman Filter  
Nano-Manipulation Based on Real-Time Compressive Tracking 期刊论文
IEEE Transactions on Nanotechnology, 2015, 卷号: 14, 期号: 5, 页码: 837-846
Authors:  Li GX(李恭新);  Wang WX(王文学);  Wang YC(王越超);  Yuan S(袁帅);  Yang WG(杨文广);  Xi N(席宁);  Liu LQ(刘连庆)
View  |  Adobe PDF(626Kb)  |  Favorite  |  View/Download:365/107  |  Submit date:2015/12/20
Nano-manipulation  Compressive Sensing  Compressive Tracking  Local Imaging.  
AFM-Based Robotic Nano-Hand for Stable Manipulation at Nanoscale 期刊论文
IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, 2013, 卷号: 10, 期号: 2, 页码: 285-295
Authors:  Hou J(侯静);  Liu LQ(刘连庆);  Wang ZY(王智宇);  Wang ZD(王志东);  Xi N(席宁);  Wang YC(王越超);  Wu CD(吴成东);  Dong ZL(董再励);  Yuan S(袁帅)
View  |  Adobe PDF(1738Kb)  |  Favorite  |  View/Download:583/119  |  Submit date:2013/10/05
Atomic Force Microscopy  Kinematics Model  Nano-hand  Nanomanipulation  Robotics  
Sensor Referenced Real-time Visual Feedback in Nanorobotic Manipulation and Assembly 专著章节/文集论文
出自: Introduction to Nanorobotic Manipulation and Assembly, Norwood, USA:Artech House, 2011, 页码: 215-238
Authors:  Liu LQ(刘连庆);  Wang YC(王越超);  Li GY(李广勇);  Xi N(席宁)
Adobe PDF(2409Kb)  |  Favorite  |  View/Download:776/186  |  Submit date:2012/07/17
Sensor Referenced Real-Time Videolization of Atomic Force Microscopy for Nanomanipulations 期刊论文
IEEE/ASME Transactions on Mechatronics, 2008, 卷号: 13, 期号: 1, 页码: 76-85
Authors:  Liu LQ(刘连庆);  Yilun Luo;  Xi N(席宁);  Wang YC(王越超);  Zhang JB(张江波);  Li GY(李广勇)
Adobe PDF(646Kb)  |  Favorite  |  View/Download:793/147  |  Submit date:2012/05/29
Atomic Force Microscopy (Afm)  Fault Detection  Local Scan  Nanomanipulation  
Real-time state estimation and fault detection for controlling atomic force microscope based Nano Manipualtion 会议论文
Proceedings of the 17th International Federation of Automatic Control (IFAC) World Congress, Seoul, Korea, July 6-11, 2008
Authors:  Liu LQ(刘连庆);  Xi N(席宁);  Luo, Yilun;  Zhang JB(张江波);  Li GY(李广勇);  Wang YC(王越超)
Adobe PDF(538Kb)  |  Favorite  |  View/Download:436/81  |  Submit date:2012/06/06
Atomic Force Microscopy  Fault Detection  Micromanipulators  Microsystems  Nanotechnology  Robotics  Technology  Visual Communication