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System positioning error compensated by local scan in atomic force microscope based nanomanipulation 会议论文
2008 3RD IEEE INTERNATIONAL CONFERENCE ON NANO/MICRO ENGINEERED AND MOLECULAR SYSTEMS, VOLS 1-3, Sanya, China, January 6-9, 2008
Authors:  Liu LQ(刘连庆);  Xi N(席宁);  Zhang JB(张江波);  Li GY(李广勇);  Wang YC(王越超);  Dong ZL(董再励)
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