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Feature referenced tip localization enhanced by probability motion model for AFM based nanomanipulations 会议论文
2011 IEEE International Conference on Robotics and Biomimetics (ROBIO), Phuket, Thailand, December 7-11, 2011
Authors:  Yuan S(袁帅);  Liu LQ(刘连庆);  Wang ZD(王志东);  Xi N(席宁);  Wang YC(王越超);  Dong ZL(董再励);  Wang ZY(王智宇);  Wang ZB(王智博)
Adobe PDF(666Kb)  |  Favorite  |  View/Download:682/152  |  Submit date:2012/06/06
Creep  Probabilistic Logic  Sensors  Trajectory  Uncertainty  Voltage Control  
A probability approach for on-line tip localization with local scan based landmark sensing in nanomanipulations 会议论文
The First International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, Changchun, China, August 29 - September 2, 2011
Authors:  Yuan S(袁帅);  Liu LQ(刘连庆);  Wang ZD(王志东);  Xi N(席宁);  Wang YC(王越超);  Dong ZL(董再励);  Wang ZY(王智宇)
View  |  Adobe PDF(652Kb)  |  Favorite  |  View/Download:635/134  |  Submit date:2012/06/06
Afm Based Nanomanipulation  On-line Tip Localization  Probability