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Online Determination of Graphene Lattice Orientation Through Lateral Forces 期刊论文
Nanoscale Research Letters, 2016, 卷号: 11, 期号: 1, 页码: 1-8
Authors:  Zhang Y(张嵛);  Yu FH(于繁华);  Li GY(李广勇);  Liu LQ(刘连庆);  Liu GJ(刘光洁);  Zhang ZY(张志勇);  Wang YC(王越超);  Wejinya, Uchechukwu C.;  Xi N(席宁)
View  |  Adobe PDF(1782Kb)  |  Favorite  |  View/Download:186/32  |  Submit date:2016/09/04
Graphene  Lattice Orientation  Manufacturing  Frequency  
In-Phase Bias Modulation Mode of Scanning Ion Conductance Microscopy With Capacitance Compensation 期刊论文
IEEE Transactions on Industrial Electronics, 2015, 卷号: 62, 期号: 10, 页码: 6508-6518
Authors:  Li P(李鹏);  Liu LQ(刘连庆);  Yang Y(杨洋);  Wang YC(王越超);  Li GY(李广勇)
View  |  Adobe PDF(2044Kb)  |  Favorite  |  View/Download:250/56  |  Submit date:2015/10/08
Capacitance Compensation (Cc)  In-phase Bias Modulation (Ipbm) Mode  Scanning Ion Conductance Microscopy (Sicm)  Signal-to-noise Ratio (Snr)  
Development of Mechanostimulated Patch-Clamp System for Cellular Physiological Study 期刊论文
IEEE/ASME TRANSACTIONS ON MECHATRONICS, 2014, 卷号: 19, 期号: 4, 页码: 1138-1147
Authors:  Zhang CL(张常麟);  Li P(李鹏);  Liu LQ(刘连庆);  Wang YC(王越超);  Gao ZB(高召兵);  Li GY(李广勇)
View  |  Adobe PDF(865Kb)  |  Favorite  |  View/Download:520/89  |  Submit date:2013/12/27
Atomic Force Microscope (Afm)  Mechanosensitive (Ms) Ion Channel  Planar Patch Clamp  
Drift Compensation in AFM-Based Nanomanipulation by Strategic Local Scan 期刊论文
IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, 2012, 卷号: 9, 期号: 4, 页码: 755-762
Authors:  Li GY(李广勇);  Wang, Yucai;  Liu LQ(刘连庆)
View  |  Adobe PDF(1131Kb)  |  Favorite  |  View/Download:689/120  |  Submit date:2012/11/29
Atomic Force Microscope (Afm)  Drift Compensation  Nanomanipulation  
Atomic Force Microscope-Based Nanorobotic System for Nanoassembly 专著章节/文集论文
出自: Nano Optoelectronic Sensors and Devices: Nanophotonics from Design to Manufacturing, Amsterdam, Netherlands:Elsevier, 2011, 页码: 51-79
Authors:  Liu LQ(刘连庆);  Xi N(席宁);  Li GY(李广勇);  Heping Chen
View  |  Adobe PDF(1736Kb)  |  Favorite  |  View/Download:766/203  |  Submit date:2012/07/17
Sensor Referenced Real-time Visual Feedback in Nanorobotic Manipulation and Assembly 专著章节/文集论文
出自: Introduction to Nanorobotic Manipulation and Assembly, Norwood, USA:Artech House, 2011, 页码: 215-238
Authors:  Liu LQ(刘连庆);  Wang YC(王越超);  Li GY(李广勇);  Xi N(席宁)
Adobe PDF(2409Kb)  |  Favorite  |  View/Download:776/186  |  Submit date:2012/07/17
Real-time state estimation and fault detection for controlling atomic force microscope based Nano Manipualtion 会议论文
Proceedings of the 17th International Federation of Automatic Control (IFAC) World Congress, Seoul, Korea, July 6-11, 2008
Authors:  Liu LQ(刘连庆);  Xi N(席宁);  Luo, Yilun;  Zhang JB(张江波);  Li GY(李广勇);  Wang YC(王越超)
Adobe PDF(538Kb)  |  Favorite  |  View/Download:435/80  |  Submit date:2012/06/06
Atomic Force Microscopy  Fault Detection  Micromanipulators  Microsystems  Nanotechnology  Robotics  Technology  Visual Communication  
System positioning error compensated by local scan in atomic force microscope based nanomanipulation 会议论文
2008 3RD IEEE INTERNATIONAL CONFERENCE ON NANO/MICRO ENGINEERED AND MOLECULAR SYSTEMS, VOLS 1-3, Sanya, China, January 6-9, 2008
Authors:  Liu LQ(刘连庆);  Xi N(席宁);  Zhang JB(张江波);  Li GY(李广勇);  Wang YC(王越超);  Dong ZL(董再励)
View  |  Adobe PDF(1691Kb)  |  Favorite  |  View/Download:420/71  |  Submit date:2012/06/06
Detection and real-time correction of faulty visual feedback in atomic force microscopy based nanorobotic manipulation 会议论文
2008 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND AUTOMATION, VOLS 1-9, Pasadena, CA, May 19-23, 2008
Authors:  Liu LQ(刘连庆);  Xi N(席宁);  Luo, Yilun;  Wang YC(王越超);  Zhang JB(张江波);  Li GY(李广勇)
View  |  Adobe PDF(1688Kb)  |  Favorite  |  View/Download:528/121  |  Submit date:2012/06/06
Sensor Referenced Real-Time Videolization of Atomic Force Microscopy for Nanomanipulations 期刊论文
IEEE/ASME Transactions on Mechatronics, 2008, 卷号: 13, 期号: 1, 页码: 76-85
Authors:  Liu LQ(刘连庆);  Yilun Luo;  Xi N(席宁);  Wang YC(王越超);  Zhang JB(张江波);  Li GY(李广勇)
Adobe PDF(646Kb)  |  Favorite  |  View/Download:791/146  |  Submit date:2012/05/29
Atomic Force Microscopy (Afm)  Fault Detection  Local Scan  Nanomanipulation