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Efficient Imaging and Real-time Display of Scanning Ion Conductance Microscopy Based on Block Compressive Sensing 会议论文
3rd International Conference on Manipulation, Manu­facturing and Measurement on the Nanoscale, 3M-NANO 2013, Suzhou, China, August 26-30, 2013
Authors:  Li GX(李恭新);  Li P(李鹏);  Wang YC(王越超);  Wang WX(王文学);  Xi N(席宁);  Liu LQ(刘连庆)
Adobe PDF(251Kb)  |  Favorite  |  View/Download:436/84  |  Submit date:2013/12/26
Scanning Ion Conductance Microscopy (Sicm)  Compressive Sensing (Cs)  Blocks Compressive Sensing