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Microscopic Machine Vision Based Degradation Monitoring of Low-Voltage Electromagnetic Coil Insulation Using Ensemble Learning in a Membrane Computing Framework 期刊论文
IEEE ACCESS, 2019, 卷号: 7, 页码: 97216-97241
Authors:  Li C(李晨);  Kong FJ(孔樊杰);  Wang K(王锴);  Xu AD(徐皑冬);  Zhang, Gexiang;  Xu, Ning;  Liu ZH(刘志华);  Guo HF(郭海丰);  Wang, Xue;  Liang, Kuan;  Yuan, Jianying;  Qi, Shouliang;  Jiang T(蒋涛)
Adobe PDF(6392Kb)  |  Favorite  |  View/Download：112/14  |  Submit date：2019/08/29
Low-voltage electromagnetic coil  insulation degradation monitoring  ensemble learning  machine vision  membrane computing  microscopic image analysis  feature extraction