SIA OpenIR

Browse/Search Results:  1-1 of 1 Help

Filters    
Selected(0)Clear Items/Page:    Sort:
High precision size measurement system of industrial profiles section 会议论文
2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER), Shenyang, China, June 8-12, 2015
Authors:  Zhang YC(张宜弛);  Wu Y(吴阳);  Zhou XF(周晓锋);  Li S(李帅)
Adobe PDF(570Kb)  |  Favorite  |  View/Download:192/61  |  Submit date:2015/12/16
Machine Vision  Double Telecentric Lens  Section Size Measurement  Subpixel