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Measuring the physical properties of the lymphoma cells using atomic force microscopy 会议论文
2010 IEEE Nanotechnology Materials and Devices Conference, NMDC2010, Monterey, CA, United states, October 12-15, 2010
Authors:  Li M(李密);  Liu LQ(刘连庆);  Xi N(席宁);  Wang YC(王越超);  Dong ZL(董再励);  Li GY(李广勇);  Xiao XB(肖秀斌);  Zhang WJ(张伟京)
Adobe PDF(388Kb)  |  Favorite  |  View/Download:627/156  |  Submit date:2012/06/06
Atomic Force Microscopy  Mechanical Properties  Nanotechnology  Oncology