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一种SICM的幅度调制成像模式扫描装置和方法 专利
专利类型: 发明, 公开日期: 2016-08-10,
Inventors:  刘连庆;  李鹏;  李广勇;  王越超;  杨洋;  周磊;  王栋
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一种用于原子力显微镜的扫描探针夹持装置 专利
专利类型: 发明, 公开日期: 2015-11-25, 公开日期: 2018-01-02
Inventors:  于鹏;  刘柱;  周磊;  杨洋;  王栋;  刘连庆;  焦念东
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一种用于原子力显微镜的扫描探针夹持装置 专利
专利类型: 发明授权, 公开日期: 2015-11-25, 公开日期: 2018-01-02
Inventors:  于鹏;  刘柱;  周磊;  杨洋;  王栋;  刘连庆;  焦念东
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Performance improvement of organic solar cells with the introduction of branched zinc oxide nanorods 期刊论文
Micro and Nano Letters, 2015, 卷号: 10, 期号: 6, 页码: 292-295
Authors:  Wei FN(魏发南);  Jiang, Minlin;  Zhou L(周磊);  Dong ZL(董再励)
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基于梯形算子的AFM驱动器非对称迟滞性校正 期刊论文
仪器仪表学报, 2015, 卷号: 36, 期号: 1, 页码: 32-39
Authors:  王栋;  于鹏;  周磊;  刘柱;  董再励
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非对称pi模型  梯形算子  原子力显微镜  压电陶瓷  迟滞性前馈校正  逆模型直接辨识  
Improving atomic force microscopy imaging by a direct inverse asymmetric PI hysteresis model 期刊论文
Sensors (Switzerland), 2015, 卷号: 15, 期号: 2, 页码: 3409-3425
Authors:  Wang D(王栋);  Yu P(于鹏);  Wang FF(王飞飞);  Chan, Ho-Yin;  Zhou L(周磊);  Dong ZL(董再励);  Liu LQ(刘连庆);  Li WJ(李文荣)
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Atomic Force Microscope  Hysteresis  Piezoelectric Actuator  Direct Inverse Asymmetric Pi Model  Feedforward Control  
Amplitude Modulation Mode of Scanning Ion Conductance Microscopy 期刊论文
Journal of Laboratory Automation, 2015, 卷号: 20, 期号: 4, 页码: 457-462
Authors:  Li P(李鹏);  Liu LQ(刘连庆);  Yang Y(杨洋);  Zhou L(周磊);  Wang D(王栋);  Wang YC(王越超);  Li GY(李广勇)
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Scanning Ion Conductance Microscopy  Am Mode  Ac Voltage  Capacitance Compensation  Nanoscale Imaging  
一种用于原子力显微镜的扫描探针夹持装置 专利
专利类型: 实用新型, 公开日期: 2014-09-10, 公开日期: 2014-09-10
Inventors:  于鹏;  刘柱;  周磊;  杨洋;  王栋;  刘连庆;  焦念东
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基于改进型DLIA的AFM探针高速振幅检测 期刊论文
微纳电子技术, 2014, 卷号: 51, 期号: 12, 页码: 791-797
Authors:  王栋;  于鹏;  周磊;  刘柱;  杨洋;  董再励
View  |  Adobe PDF(1508Kb)  |  Favorite  |  View/Download:246/50  |  Submit date:2014/12/29
原子力显微镜  轻敲模式  幅值检测  数字锁相放大器  单通道  
Large-scale assembly of Cu/CuO nanowires for nano-electronic device fabrication 期刊论文
Science China Technological Sciences, 2014, 卷号: 57, 期号: 4, 页码: 734-737
Authors:  Xu K(许可);  Tian XJ(田孝军);  Yu HB(于海波);  Yang Y(杨洋);  Zhou L(周磊);  Liu LQ(刘连庆)
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Computer Software  Electrodes  Electrophoresis  Nanoelectronics  Thermoelectric Equipment