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中国科学院沈阳自动化研究所机构知识库
Knowledge Management System of Shenyang Institute of Automation, CAS
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刘昶 [5]
史海波 [5]
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半导体封装测试生产线瓶颈检测的一种方法
期刊论文
电子器件, 2015, 卷号: 38, 期号: 1, 页码: 44-48
Authors:
张国辉
;
刘昶
;
姚丽丽
;
史海波
Adobe PDF(433Kb)
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View/Download:212/55
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Submit date:2015/03/17
半导体封装测试
生产瓶颈
瓶颈检测
识别指标
Lot release strategy semiconductor assembly and testing based on the degree of constraint of the minimum spanning tree
会议论文
26th Chinese Control and Decision Conference, CCDC 2014, Changsha, China, May 31, 2014 - June 2, 2014
Authors:
Zhang GH(张国辉)
;
Liu C(刘昶)
;
Yao LL(姚丽丽)
;
Shi HB(史海波)
Adobe PDF(460Kb)
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Submit date:2014/11/03
Graph Theory
多维度层次化生产能力核算方法
专利
专利类型: 发明, 专利号: CN103400221A, 公开日期: 2013-11-20,
Inventors:
史海波
;
刘昶
;
孙德厂
;
张国辉
;
陈海赞
Adobe PDF(1002Kb)
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Submit date:2014/04/03
基于有约束的最小生成树的半导体封装测试细日投料控制方法
专利
专利类型: 发明授权, 专利号: CN103399549B, 公开日期: 2013-11-20, 授权日期: 2015-10-28
Inventors:
张国辉
;
刘昶
;
陈海赞
;
姚丽丽
;
史海波
Adobe PDF(3403Kb)
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View/Download:150/31
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Submit date:2015/11/26
基于有约束的最小生成树的半导体封装测试细日投料控制方法
专利
专利类型: 发明, 专利号: CN103399549A, 公开日期: 2013-11-20, 授权日期: 2015-10-28
Inventors:
张国辉
;
刘昶
;
陈海赞
;
姚丽丽
;
史海波
Adobe PDF(627Kb)
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View/Download:250/22
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Submit date:2014/04/03