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基于EFM的纳米材料电学性质检测方法及实现技术研究 学位论文
博士, 沈阳: 中国科学院沈阳自动化研究所, 2015
Authors:  赵增旭
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静电力显微镜  碳纳米管  导电性  电荷  半导体类型  
The influence of probe lift-up height on CNT electrical properties measurement under EFM DC mode 期刊论文
CHINESE SCIENCE BULLETIN, 2014, 卷号: 59, 期号: 14, 页码: 1591-1596
Authors:  Zhao ZX(赵增旭);  Tian XJ(田孝军);  Liu J(刘杰);  Dong ZL(董再励);  Liu LQ(刘连庆)
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Electrical Properties Of Cnt  Efm  Lift-up Height Of Probe  Phase Response  
Detecting the electrical conductivity of single walled carbon nano-tubes by a DFM detection system 期刊论文
Science China Technological Sciences, 2014, 卷号: 57, 期号: 1, 页码: 49-54
Authors:  Zhao ZX(赵增旭);  Tian XJ(田孝军);  Liu J(刘杰);  Dong ZL(董再励);  Wang YC(王越超)
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Differentiation (Calculus)  Technology  
面向AFM的纳米目标快速重定位方法 期刊论文
中国科学:技术科学, 2014, 卷号: 44, 期号: 11, 页码: 1145-1153
Authors:  周培林;  于海波;  赵增旭;  焦念东;  刘连庆
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Afm  重定位  免标记  纳米目标  
Study on Fabrication and Characterization of Single CuO Nanowire Devices 会议论文
2013 13th IEEE International Conference on Nanotechnology, Beijing, China, August 5-8, 2013
Authors:  Huang CL(黄超雷);  Tian XJ(田孝军);  Liu J(刘杰);  Li LH(李龙海);  Zhao ZX(赵增旭);  Wang WX(王文学);  Dong ZL(董再励);  Liu LQ(刘连庆)
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Nanosensors And Actuators  Nanoassemblies And Devices  Nanofabrication  
Influence of lift up height in EFM DC mode 会议论文
International Conference on Nanoscience & Technology, China 2013, Beijing, China, September 5-7, 2013
Authors:  Zhao ZX(赵增旭);  Tian XJ(田孝军);  Liu J(刘杰);  Wang WX(王文学);  Dong ZL(董再励);  Liu LQ(刘连庆)
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Fabrication of Nanoelectrodes by Cutting Carbon Nanotubes Assembled by Di-Electrophoresis Based on Atomic Force Microscope 期刊论文
International Journal of Intelligent Mechatronics and Robotics, 2012, 卷号: 2, 期号: 3, 页码: 1-13
Authors:  Zhao ZX(赵增旭);  Tian XJ(田孝军);  Dong ZL(董再励);  Xu K(许可)
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Atomic Force Microscope (Afm)  Carbon Nanotubes (Cnt)  Di-electrophoresis (Dep)  Fabricate  Nanoeletrodes  
Cutting Assembled Carbon Nanotubes with Atomic Force Microscope for Fabrication of Nanoelectrodes 会议论文
The First International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, Changchun, China, August 29 - September 2, 2011
Authors:  Zhao ZX(赵增旭);  Tian XJ(田孝军);  Xu K(许可);  Dong ZL(董再励)
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Cnt  Afm  Nanoeletrodes